A commercially available CMOS image sensor (intended for automotive applications) is extensively tested w.r.t. reliability (temperature, humidity, storage, …). Remarkably : most of the tests are passed very successfully with 100 % yield, unfortunately not all of them. Some tests clearly show an issue with the performance of the devices. During the talk more technical details about the various tests and their outcome will be disclosed. Further research to find the root cause of the reliability issues will be discussed as well.